NEW Impedance AnalyzerZA57630
A diverse array of functions to suit any application!
Highly repeatable and accurate measurements.
Accurate assessments conducted under actual usage conditions.
Electronic parts and materials may indicate varying characteristics at different measurement frequencies or when different signal levels are applied. To assess true characteristics, it is important to take measurements under actual operating conditions by sweeping the frequency, AC amplitude and DC bias.
SWEEP Frequency, AC amplitude, DC bias, zero span AC amplitude sweep Frequency sweep DC bias sweep Zero span
Takes measurements under fixed conditions without changing frequency, AC amplitude or DC bias parameters, to observe the change in characteristics over time (horizontal axis: time)
● Also capable of spot measurements
Measures a fixed frequency, AC amplitude and DC bias, and displays the results as numerical values. Up to 6 items can be configured.
SETTING MEASUREMENT AND OTHER CONDITIONS
Settings intuitively on a single screenSetting items (SETTING VIEW) Graph axis setting Frequency settings
MEASUREMENT RANGE Auto range
Takes measurements by setting the optimal measurement range automatically while monitoring measurement results. This is effective when there are significant changes in measurement data.Fixed range
The measurement range is fixed, which prevents discontinuity (steps) in the measured value caused by changes in the range.
MEASUREMENT DELAY FUNCTION
If sweep parameters such as frequency or AC amplitude are changed while sweep is in progress, incorrect measurement results can be generated due to transient response.
The time until measurements start after parameters are changed can be delayed.
Two delay types are available: “Measurement start delay” and “Measurement delay”
AUTOMATIC HIGH DENSITY SWEEP
This function automatically raises the frequency density only for sections where the measurement data changes suddenly during frequency sweep measurements.
During resonance characteristic measurements of devices like piezoelectric vibrators and crystal oscillators, this function is useful.
ERROR CORRECTION FUNCTION
Corrections to causes of measurement errors, for accurate assessments.
To conduct accurate measurements, various measurement error causes such as residual impedance and cable length must be corrected properly.Open correction
Reduces errors caused by residual admittanceShort correction
Reduces errors caused by residual impedanceLoad correction
Corrects deviations from true values using samples with known values as standard impedancePort extension
Corrects phase errors due to transmission delay time when using long cablesSlope compensation
Removes the effect of potential fluctuation wave included in the measurement signal. Effective for measurements of samples such as batteries with potential changes due to charging and dischargingEqualizing
Measures the frequency characteristics of sensors, cables and other externally connected measurement devices, and corrects the amount of error of those measurement devicesInput weighting
Corrects the probe attenuation or pre-amp gainSelf-calibration
Reads the measurement values for X, Y1 and Y2 shown on the graph.
Up to 8 markers can be used.
Displays the difference from the standard marker (Marker 1)ΔTRKG Marker
Displays the difference in the same way as the difference marker. When marker 1 is moved, it moves while keeping the difference in the sweep value constant.Marker search function
Automatically searches points that match the setting conditions
SEQUENCE MEASUREMENT FUNCTION
Multiple measurement conditions are set in advance, and this function conducts measurements in order under those conditions.
The sweep range can be split into segments, with measurements taken under different conditions for each segment range.
Enables efficient measurements of multilayer ceramic capacitors (MLCC), and other devices with characteristics that vary with voltage.
GRAPH DISPLAY SINGLE/SPLIT display
Select from “SINGLE” with one graph shown per screen, or “SPLIT” with two graphs shown top and bottomPhase display control
±180°, 0° to +360°, −360° to 0°, UNWRAP (continuous display), 360° shift, aperture (group delay characteristics)Trace control
Allows overwriting of measurement data trace (MEAS) and up to 8 reference data traces (REF)Auto store
After sweep measurement is completed, this function automatically copies the MEAS trace to the REF trace.
● SPLIT display
● Auto store
RESONANT FREQUENCY TRACKING FUNCTION
During measurement of samples with resonance, this function automatically tracks the measurement frequency with the sample resonant frequency. Measurement can always be conducted to match the resonant frequency. A convenient function for continuous measurements close to the resonant frequency of piezoelectric devices.
EQUIVALENT CIRCUIT ESTIMATION FUNCTION
A function that determines the LCR element value (values for impedance, electrostatic capacitance and resistance) by applying the impedance characteristics acquired with frequency sweep measurements to equivalent circuit models.
The following 6 models are included.
Equivalent circuit model
PIEZOELECTRIC CONSTANT CALCULATION FUNCTION
Function that measures frequency-impedance characteristics of piezoelectric ceramics to calculate the electromechanical coupling factor, piezoelectric constant and others.
∗JEITA standard-compliant method “EM-4501A Electrical test methods for piezoelectric ceramic vibrators”.
RELATIVE PERMITTIVITY MEASUREMENT
Sample dimensions and other information is set in advance, to calculate and display the complex relative permittivity from impedance measurement results (Cp, Rp).
● Relative permittivity εs
● Relative permittivity, real εs’
● Relative permittivity, imaginary εs”
● Loss ratio Dε
RELATIVE MAGNETIC PERMEABILITY MEASUREMENT
Sample dimensions and other information are set in advance, to calculate and display the complex relative magnetic permeability from impedance measurement results (Ls, Rs).
● Relative magnetic permeability µs
● Relative magnetic permeability, real µs’
● Relative magnetic permeability, imaginary µs”
● Loss ratio Dµ
COMPARATOR/HANDLER INTERFACE Ideal for production lines!
Measurement up to 0.5 ms/point to shorten takt time
Also with parts selection function!!
The comparator is a function that allows samples to be sorted or passed/rejected by setting the criteria range in advance based on measurement results.
Comparator setting screen
Sorts results in up to 14 categories.
Determines pass/reject based on the set range.
Determines pass/reject based on sweep measurement results in two-dimensions, X axis (sweep parameter) and Y1, Y2 axes (measurement results).
The comparator criteria results can be output to the handler interface connector. Connect a parts handler to create an automated parts sorting system.
EXTERNAL REFERENCE CLOCK
An external 10 MHz clock signal can be used as the reference clock.
Using a reference clock with a higher precision than the internal reference clock helps to improve the measurement frequency accuracy and stability.
The use of a reference clock common with other devices also allows for the same frequency accuracy.
Measurement conditions and measurement data can be saved and loaded onto the internal memory or USB memory storage.
● Electrochemical impedance characteristics measurements
Functions cover a range of measurements of electrochemical impedance characteristics, such as battery internal impedance measurements.