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home > Products > Power Supply and Power Control Products > AC Power Source > ES series > Low Frequency Immunity Test
Product Information

AC Power Source
Programmable AC/DC Power Source
ES series

Easy to Conduct Various Specification Tests and Simulations.



Low Frequency Immunity Test

Standard Name
Test Name
IEC 61000-4-11:2004
Voltage dips, short interruptions, voltage variations*1
IEC 61000-4-13:2002 +A1:2009
+A2:2015
Harmonics combination (Flat curve)
Harmonics combination (Overswing)
Sweep in frequency *2
Individual harmonics *2
Interharmonics *2
Meister curve *2

IEC 61000-4-14:1999 + A1:2001 + A2:2009

Voltage fluctuation
IEC 61000-4-27:2000 + A1:2009 Unbalance*3
IEC 61000-4-28:1999 + A1:2001 + A2:2009 Variation of power frequency
IEC 61000-4-29:2000 Voltage dips, short interruptions, voltage variations on d.c. input power port*3
IEC 61000-4-34:2005 +A1:2009 Voltage dips, short interruptions, voltage variations for equipment with input current more than 16A per phase*1
Other tests Abrupt voltage and/or phase change
Phase unbalance in single-phase three-wire systems and three-phase systems
Arbitrary waveforms
*1 Preliminary tests can be conducted with ES0406D. In the case of comformance tests, the following products are required.
[ IEC61000-4-11 ]
[ IEC61000-4-34 ]
Custom-made voltage dip simulators are required.
*2 In the case of single-phase, a 2-channel function generator WF1974or WF1948 is required.
In the case of three-phase, three WF1974s or WF1948s are required.
*3 Preliminary tests can be conducted with ES0406D

* Immunity Test Software   ES0406D (option) *

This is application software for ES series to perform low frequency immunity tests. With this software, complicated tests can be conducted easily.

Model Description
ES0406D Immunity Test Software
ES0406D-U Immunity Test Software (Upgrade)
* Upgraded software for ES0406C users
ES0406C_menu
menu

Remote control function allows you to set voltage/frequency, switch range, and turn on/off output.
Arbitrary waveforms can be edited/created. The waveform data retrieved from digital oscilloscopes can be loaded as a text file.
The test result report creating function allows you to output the results of tests into a file.
* Peripheral cables and parts other than ES series, ES0406D, and PC may be needed, depending on the specification test. Contact us for details.



Remote controller
IEC61000-4-11
 
Voltage dips, short interruptions and voltage variations  
 
IEC61000-4-13
Harmonic cmbination test (flat curve) Harmonic combination test (over swing)
Interharmonics Meister curve
 
IEC61000-4-14 IEC61000-4-27
Voltage fluctuation Unbalance
 
IEC61000-4-28 IEC61000-4-29
Variation of power frquency Voltage dips, short interruptions and voltage variations on d.c. input power port
 
IEC61000-4-34  
 
Voltage dips, short interruptions and voltage variations(>16A)  
 
Out of standard
Abrupt change in phase and voltage Unbalance in single-phase three-wire systems and three-phase systems
 
Arbitrary waveforms  
 

HARDWARE REQUIREMENTS
CPU : 1.6 GHz or higher
Memory : 1 GB (32-bit) / 2 GB (64-bit) or higher
Hard disk space : 4 GB or higher
Display : 1024768 pixels or more ; 256 colors or more
OS : Windows 7 (32-bit, 64-bit), 8.1 (32-bit, 64-bit), 10 (32-bit, 64-bit)
        English or Japanese Language Edition (Microsoft)
Disk drive : CD-ROM drive
GPIB Interface (Use one of the followings)
PCIe-GPIB board, PCIe-GPIB+board, USB-GPIB-B/HS+ (All by National Instruments)




Other Specifications Tests

Standard Name Test Name
IEC 61000-3-2 Harmonic current emissions(≤16A)
JIS C 61000-3-2 Harmonic current emissions(≤20A)
IEC 61000-3-12 Harmonic current emissions(16A to 75A)
IEC 61000-3-3 Voltage changes, Voltage fluctuations, Flicker (≤16A)
IEC 61000-3-11 Voltage changes, Voltage fluctuations, Flicker (≤75A)
*Ask us for testing systems for above standards.
JIS standard test UL standard test JEIDA standard test JASO standard test Lloyd's standard test RTCA standard test Tests on system interconnection protection system of small photovoltaic cell power generation systems Various in-house tests


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